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New & Used Scanning Electron Microscope

 
 
 
 
Item Details
Seller details
Item Price (USD)
Year manufactured

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Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: JSM-6400F
Location: United States, Michigan
23,500
1989

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Device: Scanning Electron Microscope
Manufacturer: Zeiss
Model: SUPRA 40
Location: United States, Massachusetts
290,000
2008

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Device: Scanning Electron Microscope
Manufacturer: Philips
Model: SEM 515
Location: Russia, Moscow City
10,000
This Seller accepts SafeTrade as a payment method
1985

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Device: Scanning Electron Microscope
Manufacturer: Philips
Model: SEM 515
Location: Russia, Moscow City
10,000
This Seller accepts SafeTrade as a payment method
1985

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Device: Scanning Electron Microscope
Manufacturer: Hitachi
Model: S-2400
Location: United Kingdom, Cambridgeshire
15,500
This Seller accepts SafeTrade as a payment method
-

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Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: JSM-5200
Location: United Kingdom, Cambridgeshire
12,500
This Seller accepts SafeTrade as a payment method
-

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Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: JSM-6701F
Location: United States, California
110,000
2010

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Device: Scanning Electron Microscope
Manufacturer: Micrion
Model: 9500
Location: United States, North Carolina
225,000
1996

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Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: 5300
Location: United States, North Carolina
45,000
1996

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Device: Scanning Electron Microscope
Manufacturer: Zeiss
Model: EVO 50H
Location: United States, North Carolina
135,000
2008

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Device: Scanning Electron Microscope
Manufacturer: FEI
Model: FIB 830
Location: United States, North Carolina
400,000
1998

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Device: Scanning Electron Microscope
Manufacturer: FEI
Model: XL30
Location: United States, North Carolina
65,000
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Scanning Electron Microscope may also be referred to as :

Scanning Electron Microscope | SEM | Microscopes, Electron, Scanning