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New & Used Scanning Electron Microscope, FEI

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Manufacturer : FEI

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DualBeam 860 (1)
FIB 830 (2)
Quanta 200 (1)
XL 810 (1)
XL30 (1)
XL30 ESEM (1)
XL30 FEG (1)

60,000-70,000 (1)
100,000-200,000 (3)
200,000-300,000 (1)
400,000-500,000 (1)
500,000-600,000 (1)

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Complete Systems (8)

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Item Details

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Item Price (USD)

Year manufactured

Quick Look

Device: Scanning Electron Microscope
Manufacturer: FEI
Model: FIB 830

Location: United States, North Carolina

400,000

1998

Quick Look

Device: Scanning Electron Microscope
Manufacturer: FEI
Model: DualBeam 860

Location: United States, North Carolina

Negotiable

-

Quick Look

Device: Scanning Electron Microscope
Manufacturer: FEI
Model: XL 810

Location: United States, North Carolina

250,000

-

Quick Look

Device: Scanning Electron Microscope
Manufacturer: FEI
Model: XL30

Location: United States, North Carolina

65,000

-

Quick Look

Device: Scanning Electron Microscope
Manufacturer: FEI
Model: XL30 ESEM

Location: United States, North Carolina

100,000

-

Quick Look

Device: Scanning Electron Microscope
Manufacturer: FEI
Model: XL30 FEG

Location: United States, North Carolina

135,000

1996

Quick Look

Device: Scanning Electron Microscope
Manufacturer: FEI
Model: FIB 830

Location: United States, North Carolina

550,000

-

Quick Look

Device: Scanning Electron Microscope
Manufacturer: FEI
Model: Quanta 200

Location: United States, North Carolina

195,000

-

Scanning Electron Microscope may also be referred to as :

Scanning Electron Microscope | SEM | Microscopes, Electron, Scanning