New & Used Scanning Electron Microscope, Jeol
- Complete Systems (3)
Item Details
Seller details
Item Price (USD)
Year manufactured
Quick Look
Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: 5300
Manufacturer: Jeol
Model: 5300
Location: United States, North Carolina
45,000
1996
Quick Look
Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: JSM-6401F
Manufacturer: Jeol
Model: JSM-6401F
Location: United States, North Carolina
100,000
-
Quick Look
Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: JSM-7401F
Manufacturer: Jeol
Model: JSM-7401F
Location: United States, North Carolina
Negotiable
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