New & Used Scanning Electron Microscope, Jeol

Market Value Calculator
 
Applied Filters

Manufacturer : Jeol

  Reset
 
 
 
 
Item Details
Seller details
Item Price (USD)
Year manufactured

Quick Look

 
Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: 5300
Location: United States, North Carolina
45,000
1996

Quick Look

 
Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: JSM-6401F
Location: United States, North Carolina
100,000
-

Quick Look

 
Device: Scanning Electron Microscope
Manufacturer: Jeol
Model: JSM-7401F
Location: United States, North Carolina
Negotiable
-

Scanning Electron Microscope may also be referred to as :

Scanning Electron Microscope | SEM | Microscopes, Electron, Scanning