Used Scanning Electron Microscope - FEI -  DualBeam 860

Item 915652401

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Status: Open
Item type: Complete System
Category: Laboratory
Device: Scanning Electron Microscope
Manufacturer: FEI
Model: DualBeam 860
Condition: Refurbished - major parts replacement
Year refurbished: 2010
Location: United States, Oregon
Availability: Immediate
Quantity: 1 available
Unit Price: Negotiable
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Item Description
Used FEI DualBeam 860
3nm, Schottky FEG, Magnum Ion, 2 GIS, 8" Cassette Loader, 200mm stage
Sale Information
Payment
Payment methods: Bank Transfer
Advance payment percentage: 50%
Services supplied by the seller
Service contract
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The item is not packed
Inspection
Seller allows inspection of item? Yes
Available for inspection from: Immediate
Warranty
Period: 1 Month
Warranty type: Labor & Material
 
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Scanning Electron Microscope may also be referred to as: Scanning Electron Microscope | SEM | Microscopes, Electron, Scanning
Seller details
Location: United States, North Carolina
Business type: Broker
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