Used Scanning Electron Microscope - FEI -  FIB 830

Item 943717584

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Status: Open
Item type: Complete System
Category: Laboratory
Device: Scanning Electron Microscope
Manufacturer: FEI
Model: FIB 830
Condition: Refurbished - major parts replacement
Year manufactured: 1998
Year refurbished: 2010
Location: United States, Oregon
Availability: Immediate
Quantity: 1 available
Unit Price: 400,000.00 USD
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Item Description
Model: FEI 830 DualBeam
Type: DualBeam (SEM/FIB)
Year MFG: 1998
Back to the instrument list Location: Portland Oregon
Warranty: 30 Days
Installation: Included
Price: $400,000
In crates. To be refurbished

Beam Data:
- Electron Column
3nm at 1kV, ~15mm WD
Schottky field emission electron column
0.5-30kV

- Ion Column
7nm at 30kV, ~17mm WD,
Ga LMIS, Magnum ion column
22nA current
10-30kV

Specimen Stage:

200mm 5 axis motorized, computerized eucentric tilt stage
200mm Load Lock for wafers and pieces

Detectors:

E-Beam :In-lens Sec and Bse
I-Beam: CDEM

Computer/Software

Win NT OS
FEI xp 2.25

Gas:

Up to 4 GIS

Other components:

EDX REady

Vacuum System:

Turbo Chamber Vacuum, Mechanical RP
Sale Information
Payment
Payment methods: Bank Transfer
Advance payment percentage: 50%
Services supplied by the seller
Service contract
Installation
Training
Packaging
The item is not packed
Inspection
Seller allows inspection of item? Yes
Available for inspection from: Immediate
Warranty
Period: 1 Month
Warranty type: Labor & Material
 
All item information on this page has been supplied by seller and MedWOW cannot guarantee its accuracy.
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Scanning Electron Microscope may also be referred to as: Scanning Electron Microscope | SEM | Microscopes, Electron, Scanning
Seller details
Location: United States, North Carolina
Business type: Broker
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