Used Scanning Electron Microscope - FEI -  XL30 FEG

Item 954820845

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Status: Open
Item type: Complete System
Category: Laboratory
Device: Scanning Electron Microscope
Manufacturer: FEI
Model: XL30 FEG
Condition: Refurbished - major parts replacement
Year manufactured: 1996
Year refurbished: 2010
Location: United States, Oregon
Availability: Immediate
Quantity: 1 available
Unit Price: 135,000.00 USD
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Item Description
Used FEI XL30 FEG
Schottky FEG, 50mm STG

 Questions and Answers Regarding this Item 
 
QuestionAnswer
General: Are there any visual or non visual damages? Awaiting Confirmation
General: Does the price include system crating? Awaiting Confirmation
General: Hardware / Software? Awaiting Confirmation
Manuals & Documentation: Is there an operation manual? Awaiting Confirmation
Manuals & Documentation: Are there purchasing documents of the device? Awaiting Confirmation
Manuals & Documentation: Is there a log of repair parts? Awaiting Confirmation
Service & Warranty: Is there a warranty period after installation? Awaiting Confirmation
Sale Information
Payment
Payment methods: Bank Transfer
Advance payment percentage: 50%
Services supplied by the seller
Service contract
Installation
Training
Packaging
The item is not packed
Inspection
Seller allows inspection of item? Yes
Available for inspection from: Immediate
Warranty
Period: 1 Month
Warranty type: Labor & Material
 
All item information on this page has been supplied by seller and MedWOW cannot guarantee its accuracy.
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Scanning Electron Microscope may also be referred to as: Scanning Electron Microscope | SEM | Microscopes, Electron, Scanning
Seller details
Location: United States, North Carolina
Business type: Broker
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