MedWOW / Medical Equipment / Laboratory Equipment / Scanning Electron Microscope / Hitachi / S-4700 FEG SEM

Used Scanning Electron Microscope - Hitachi - S-4700 FEG SEM

Item 7104475309

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Status:	Open
Item type:	Complete System
Category:	Laboratory
Device:	Scanning Electron Microscope
Manufacturer:	Hitachi
Model:	S-4700 FEG SEM
Condition:	Refurbished - major parts replacement
Year manufactured:	1999
Year refurbished:	2010
Location:	United States, California
Availability:	Immediate

Quantity:	1 available
Unit Price:	195000 195,000.00 USD

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Item Description

Refurbished Hitachi S-4700 FEG
Cold FEG, Type 2, PCI

Electron Beam:
Cold Field Emission, 30kV, 2.1nm@1kV

Specimen Stage:
Type II: 5 axis, 5 motorized, Eucentric Tilt, xy:100mm x 50mm, 6" load lock

Detectors:
Sec

Analytical:
EDX Ready

Computer/Software:
Windows 95, PCI 5.0
Network Card

Vacuum System:
Diffusion w/mechanical RP

Sale Information

Payment

Payment methods: Bank Transfer

Advance payment percentage: 50%

Services supplied by the seller

Service contract

Installation

Training

Packaging

The item is not packed

Inspection

Seller allows inspection of item? Yes

Available for inspection from: Immediate

Warranty

Period: 1 Month

Warranty type: Labor & Material

All item information on this page has been supplied by seller and MedWOW cannot guarantee its accuracy.

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